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Volumn 33, Issue , 2010, Pages 157-162

The research of optical 3D measuring precision influencing factor in reverse engineering

Author keywords

3D measuring; Measuring precision; Reverse engineering

Indexed keywords

3D MEASURING; DATA MEASUREMENTS; INFLUENCING FACTOR; MEASURING EQUIPMENTS; MEASURING ERRORS; MEASURING PRECISION; OPTICAL MEASURING; PRIMARY FACTORS;

EID: 78650955671     PISSN: 16609336     EISSN: 16627482     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/AMM.33.157     Document Type: Conference Paper
Times cited : (4)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.