Fast quality-guided flood-fill phase unwrapping algorithm for three-dimensional fringe pattern profilometry

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7855, Issue , 2010, Pages

  Chen, Ke ^a   Xi, Jiangtao ^a   Yu, Yanguang ^a   Chicharo, Joe F ^a  

^a UNIVERSITY OF WOLLONGONG   (Australia)

Author keywords

Fringe Pattern profilometry (FPP); Phase unwrapping; Three dimension measurement

Indexed keywords

ADJACENT PIXELS; FRINGE PATTERN; FRINGE PATTERN PROFILOMETRY (FPP); PATH-FOLLOWING ALGORITHM; PHASE MAPS; PHASE UNWRAPPING; PHASE UNWRAPPING ALGORITHM; PHASE VARIANCE; QUALITY MAPS; THREE-DIMENSION; WRAPPED PHASE MAP;

INDUSTRIAL APPLICATIONS; OPTICAL VARIABLES MEASUREMENT; PROFILOMETRY; SIGNAL NOISE MEASUREMENT; THREE DIMENSIONAL;

ALGORITHMS;

EID: 78650872235     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.870232     Document Type: Conference Paper

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