A method to estimate snow water equivalent using multi-angle X-band radar observations

International Geoscience and Remote Sensing Symposium (IGARSS)

Volumn , Issue , 2010, Pages 3774-3776

  Du, Jinyang ^a   Shi, Jiancheng ^a,b   Xiong, Chuan ^a  

^a INSTITUTE OF REMOTE SENSING APPLICATIONS   (China)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Optical thickness; Single scattering albedo; Snow water equivelant

Indexed keywords

MICROWAVE SENSORS; OPTICAL PROPERTIES; REMOTE SENSING; SNOW MELTING SYSTEMS; SOILS; SOLAR RADIATION; SURFACE SCATTERING; SYNTHETIC APERTURE RADAR;

BACKSCATTERING SIGNALS; HIGH FREQUENCY RADAR; INVERSION ALGORITHM; OPTICAL THICKNESS; SINGLE SCATTERING ALBEDO; SNOW WATER; SNOW WATER EQUIVALENT; VOLUME SCATTERING;

SNOW;

EID: 78650863991     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IGARSS.2010.5651642     Document Type: Conference Paper

References (3)

1. Du Jinyang, Shi Jiancheng, Rott Helmut, "Comparison between a multi-scattering and multi-layer snow scattering model and its parameterized snow backscattering model", Remote Sensing of Environment, vol. 114, pp. 1089-1098, 2010.
2. Jinyang Du, J. Shi, "Development of A Parameterized Snow Scattering Model," Proc. 2007 IEEE International Geoscience and Remote Sensing Symposium (IGARSS'08), 2008.
3. J. Shi and J. Dozier, "Estimation of Snow Water Equivalence Using SIR-C/X-SAR, Part II: Inferring snow depth and particle size", IEEE Transactions on Geoscience and Remote Sensing, Vol. 38, No. 6, pp. 2475-2488, Nov. 2000. (Pubitemid 32076145)