Automated acceptance testing using fit

Proceedings of the 42nd Annual Hawaii International Conference on System Sciences, HICSS

Volumn , Issue , 2009, Pages

  Hanssen, Geir Kjetil ^a   Haugset, Børge ^b  

^a SINTEF   (Norway)

^b SINTEF ICT   (Norway)

Author keywords

[No Author keywords available]

Indexed keywords

ACCEPTANCE TESTS; AGILE DEVELOPMENT; AGILE TESTING; AUTOMATED ACCEPTANCE TESTING; INDUSTRIAL CASE STUDIES;

TESTING;

AGILE MANUFACTURING SYSTEMS;

EID: 78650760916     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/HICSS.2009.83     Document Type: Conference Paper

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