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Volumn 97, Issue 25, 2010, Pages

Direct minority carrier lifetime measurements and recombination mechanisms in long-wave infrared type II superlattices using time-resolved photoluminescence

(4) Connelly, Blair C a Metcalfe, Grace D a Shen, Hongen a Wraback, Michael a

a U S ARMY RESEARCH LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACCEPTOR LEVELS; AUGER RECOMBINATION; EXCITATION DENSITY; FREEZE OUT; INAS/GASB; INJECTION MEASUREMENT; LONGWAVE INFRARED; MINORITY CARRIER LIFETIMES; OPTICAL MEASUREMENT; RADIATIVE RECOMBINATION; RECOMBINATION MECHANISMS; SHOCKLEY-READ-HALL RECOMBINATIONS; TIME-RESOLVED PHOTOLUMINESCENCE; TYPE-II SUPERLATTICES; UPPER LIMITS;

INDIUM ANTIMONIDES; INFRARED DEVICES; INFRARED RADIATION; OPTICAL DATA PROCESSING; PHOTOLUMINESCENCE; SUPERLATTICES; WAVES;

CARRIER LIFETIME;

EID: 78650737135 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3529458 Document Type: Article

Times cited : (140)

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