In-depth analysis of the CuIn1-x Gax Se2 film for solar cells, structural and optical characterization

Applied Physics Letters

Volumn 97, Issue 25, 2010, Pages

  Slobodskyy, A ^a,b   Slobodskyy, T ^c   Ulyanenkova, T ^c   Doyle, S ^c   Powalla, M ^b   Baumbach, T ^c   Lemmer, U ^a  

^a KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^b ZENTRUM FÜR SONNENENERGIE UND WASSERSTOFF FORSCHUNG BADEN WÜRTTEMBERG ZSW   (Germany)

^c KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORBER LAYERS; ABSORBER THICKNESS; BACK CONTACT; BAND GAPS; COMPOSITION GRADIENT; IN-DEPTH ANALYSIS; LAYER GROWTH; OPTICAL CHARACTERIZATION; PHOTOLUMINESCENCE MEASUREMENTS; POLYCRYSTALLINE; STRAIN PROFILES; TEXTURE DEPTH; X-RAY DIFFRACTION MEASUREMENTS;

ENERGY GAP; GALLIUM; MOLYBDENUM; X RAY DIFFRACTION;

SOLAR CELLS;

EID: 78650736294     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3529939     Document Type: Article

References (6)

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