메뉴 건너뛰기




Volumn 13, Issue 3, 1996, Pages 84-94

A software reliability growth model

Author keywords

Models; Reliability; Software development

Indexed keywords


EID: 78650734916     PISSN: 0265671X     EISSN: None     Source Type: Journal    
DOI: 10.1108/02656719610116108     Document Type: Article
Times cited : (2)

References (17)
  • 3
    • 0002979446 scopus 로고
    • Software reliability research
    • Ferberger, W. (Ed.), Academic Press, New York, NY
    • Jelenski, Z., Moranda, P. (1972), "Software reliability research" in Ferberger, W. (Ed.), Statistical Computer Performance Evaluation, Academic Press, New York, NY, pp. 465-84.
    • (1972) Statistical Computer Performance Evaluation , pp. 465-484
    • Jelenski, Z.1    Moranda, P.2
  • 4
    • 0015764839 scopus 로고
    • A Bayesian reliability growth model for computer software
    • Littlewood, B., Verrall, J.L. (1973), "A Bayesian reliability growth model for computer software" in Applied Statistics, Vol. 22, pp. 332-46.
    • (1973) Applied Statistics , vol.22 , pp. 332-346
    • Littlewood, B.1    Verrall, J.L.2
  • 5
    • 0024032574 scopus 로고
    • A Bayes empirical-Bayes model for software reliability
    • Mazzuchi, T.A., Soyer, R. (1988), "A Bayes empirical-Bayes model for software reliability" in IEEE Transactions on Reliability, Vol. 37, No. 2, pp. 248-54.
    • (1988) IEEE Transactions on Reliability , vol.37 , Issue.2 , pp. 248-254
    • Mazzuchi, T.A.1    Soyer, R.2
  • 6
    • 84921124481 scopus 로고
    • A Bayes empirical Bayes approach for (software) reliability growth
    • The Interface, North Holland, Amsterdam
    • Horigome, M., Singpurwalla, N.D., Soyer, R. (1985), "A Bayes empirical Bayes approach for (software) reliability growth" in Computer Science and Statistics, The Interface, North Holland, Amsterdam, pp. 47-55.
    • (1985) Computer Science and Statistics , pp. 47-55
    • Horigome, M.1    Singpurwalla, N.D.2    Soyer, R.3
  • 7
    • 84887285909 scopus 로고    scopus 로고
    • Assessing (software) reliability growth using a random coefficient autoregressive process and its ramifications
    • Singpurwalla, N.D., Soyer, R., "Assessing (software) reliability growth using a random coefficient autoregressive process and its ramifications", IEEE Transactions on Software Engineering.
    • IEEE Transactions on Software Engineering
    • Singpurwalla, N.D.1    Soyer, R.2
  • 8
    • 51849176383 scopus 로고
    • Approximate Bayesian methods
    • Lindley, D.V. (1980), "Approximate Bayesian methods" in Trabajos Estadistica, Vol. 31, pp. 223-37.
    • (1980) Trabajos Estadistica , vol.31 , pp. 223-237
    • Lindley, D.V.1
  • 11
    • 84887285281 scopus 로고    scopus 로고
    • A quasi-Bayes estimate of the failure intensity of a reliability growth model
    • Higgins, J., Tsokos, C.P., "A quasi-Bayes estimate of the failure intensity of a reliability growth model", IEEE Transactions on Reliability.
    • IEEE Transactions on Reliability
    • Higgins, J.1    Tsokos, C.P.2
  • 13
    • 0001782167 scopus 로고
    • Reliability analysis for complex repairable systems
    • SIAM, Philadelphia, PA
    • Crow, L.H. (1974), "Reliability analysis for complex repairable systems" in Reliability and Biometry, SIAM, Philadelphia, PA, pp. 379-410.
    • (1974) Reliability and Biometry , pp. 379-410
    • Crow, L.H.1
  • 14
    • 84948866199 scopus 로고
    • Confidence bounds on the parameters of the Weibull process
    • Finkelstein, J.M. (1976), "Confidence bounds on the parameters of the Weibull process" in Technometrics, Vol. 18, pp. 115-17.
    • (1976) Technometrics , vol.18 , pp. 115-117
    • Finkelstein, J.M.1
  • 15
    • 0017936779 scopus 로고
    • Some results on inference for the Weibull process
    • Lee, L., Lee, S.K. (1978), "Some results on inference for the Weibull process" in Technometrics, Vol. 20, pp. 41-5.
    • (1978) Technometrics , vol.20 , pp. 41-45
    • Lee, L.1    Lee, S.K.2
  • 16
    • 1642541462 scopus 로고
    • Prediction intervals for the Weibull process
    • Englehardt, M., Bain, L.J. (1978), "Prediction intervals for the Weibull process" in Technometrics, Vol. 20, pp. 167-9.
    • (1978) Technometrics , vol.20 , pp. 167-169
    • Englehardt, M.1    Bain, L.J.2
  • 17
    • 84555201809 scopus 로고
    • PhD dissertation submitted to the Department of Mathematics, University of South Florida, Tampa
    • Suresh, N. (1992), "Modelling and analysis of software reliability", PhD dissertation submitted to the Department of Mathematics, University of South Florida, Tampa.
    • (1992) Modelling and analysis of software reliability
    • Suresh, N.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.