A patent examining expert system using pattern recognition

Expert Systems with Applications

Volumn 38, Issue 4, 2011, Pages 4302-4311

  Park, Sang Sung ^a   Jung, Won Gyo ^a   Shin, Young Geun ^a   Jang, Dong Sik ^a  

^a Korea University   (South Korea)

Author keywords

Database; Examining System; Patent; Pattern recognition; Text mining

Indexed keywords

AVERAGE NUMBERS; BOUNDARY VALUES; DATABASE; EXAMINING SYSTEM; INPUT VALUES; K-MEANS; PATENT; PATENT ATTORNEYS; PATENT DOCUMENTS; PATTERN RECOGNITION ALGORITHMS; PERCEPTRON; REGULARIZED DISCRIMINANT ANALYSIS; RELEVANT DOCUMENTS; TEXT MINING; WEIGHT VALUES;

ALGORITHMS; CHARACTER RECOGNITION; DATA MINING; DATABASE SYSTEMS; DISCRIMINANT ANALYSIS; EXPERT SYSTEMS; FORECASTING; PATTERN RECOGNITION SYSTEMS;

PATENTS AND INVENTIONS;

EID: 78650701988     PISSN: 09574174     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.eswa.2010.09.099     Document Type: Article

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