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Volumn 13, Issue 3, 2011, Pages 1210-1213
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A facile approach for quantifying the density of defects (edge plane sites) of carbon nanomaterials and related structures
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Author keywords
[No Author keywords available]
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Indexed keywords
CARBON NANOTUBE;
ARTICLE;
CHEMISTRY;
ELECTROCHEMICAL ANALYSIS;
ELECTRODE;
ELECTRON TRANSPORT;
OXIDATION REDUCTION REACTION;
ELECTROCHEMICAL TECHNIQUES;
ELECTRODES;
ELECTRON TRANSPORT;
NANOTUBES, CARBON;
OXIDATION-REDUCTION;
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EID: 78650470043
PISSN: 14639076
EISSN: None
Source Type: Journal
DOI: 10.1039/c0cp01562h Document Type: Article |
Times cited : (30)
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References (35)
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