Robust local binary pattern feature sets for periocular biometric identification

IEEE 4th International Conference on Biometrics: Theory, Applications and Systems, BTAS 2010

Volumn , Issue , 2010, Pages

  Xu, Juefei ^a   Cha, Miriam ^a   Heyman, Joseph L ^a   Venugopalan, Shreyas ^a   Abiantun, Ramzi ^a   Savvides, Marios ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BINARY PATTERNS; BIOMETRIC IDENTIFICATIONS; CORRELATION FEATURES; DATA SETS; DISTANCE MEASURE; FACIAL FEATURE; FACIAL IMAGES; FALSE ACCEPT RATE; FEATURE EXTRACTION METHODS; FEATURE SETS; FILTER-BASED TECHNIQUE; LOCAL BINARY PATTERNS; LOCAL FEATURE EXTRACTION; REGION OF HUMAN FACES; SIMILARITY MATRIX; STAND-ALONE MODES; UNCONTROLLED ILLUMINATION;

ANTHROPOMETRY; BIOMETRICS; EXPERIMENTS;

FEATURE EXTRACTION;

EID: 78650393950     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/BTAS.2010.5634504     Document Type: Conference Paper

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