|
Volumn 1245, Issue , 2010, Pages 77-82
|
A new approach to light scattering from nanotextured interfaces for thin-film silicon solar cells
a a a a a,b a,c a
a
EPFL
(Switzerland)
|
Author keywords
[No Author keywords available]
|
Indexed keywords
LIGHT-TRAPPING;
NANO-IMPRINTING;
NANOTEXTURED;
NEW APPROACHES;
SCATTERING PROPERTY;
SPECTRAL DEPENDENCES;
THEORETICAL FRAMEWORK;
THIN-FILM SILICON SOLAR CELLS;
ZNO;
ZNO SURFACE;
AMORPHOUS FILMS;
LIGHT REFRACTION;
LIGHT SCATTERING;
MORPHOLOGY;
REFRACTION;
REFRACTIVE INDEX;
REFRACTOMETERS;
SILICON SOLAR CELLS;
SOLAR CELLS;
ZINC OXIDE;
AMORPHOUS SILICON;
|
EID: 78650370514
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (2)
|
References (10)
|