Effect of FeCoB-SiO2-film-based fractal frequency selective surface on the absorption properties of microwave absorbers

IEEE Magnetics Letters

Volumn 1, Issue , 2010, Pages

  Liao, Zhangqi ^a   Nie, Yan ^a   Ren, Wenyi ^a   Wang, Xian ^a   Gong, Rongzhou ^a  

^a HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

FeCoB SiO2thin films; fractal; frequency selective surfaces (FSSs); microwave absorbers; Soft magnetic materials

Indexed keywords

ABSORPTION CHARACTERISTICS; ABSORPTION PROPERTY; ALUMINUM FILM; ARGON PRESSURE; FECOB-SIO2THIN FILMS; FREQUENCY SELECTIVE SURFACES; LASER ETCHING; MICROWAVE ABSORBERS; NONMAGNETICS; PEAK FREQUENCIES; RADIO FREQUENCY MAGNETRON SPUTTERING; REFLECTION PROPERTIES;

ABSORPTION; ARGON; BANDWIDTH; DIPOLE ANTENNAS; ELECTROMAGNETIC WAVE POLARIZATION; FRACTALS; MAGNETIC DEVICES; MAGNETIC FILMS; MAGNETIC THIN FILMS; MAGNETISM; METALLIC FILMS; MICROWAVES; SILICON COMPOUNDS; SOFT MAGNETIC MATERIALS; SURFACES;

FILM PREPARATION;

EID: 78650370234     PISSN: 1949307X     EISSN: None     Source Type: Journal    
DOI: 10.1109/LMAG.2010.2076400     Document Type: Article

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