Thermoelectric properties of Zr0.5Hf0.5Ni 0.8Pd0.2Sn0.99Sb0.01 half-Heusler alloy with WO3 inclusions

Materials Research Society Symposium Proceedings

Volumn 1267, Issue , 2010, Pages 225-230

  Makongo, Julien P A ^a   Paudel, Pravin ^a   Misra, Dinesh K ^a   Poudeu, Pierre F P ^a  

^a UNIVERSITY OF NEW ORLEANS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRICAL CONDUCTIVITY; FIGURE OF MERIT; HALF-HEUSLER; HALF-HEUSLER ALLOYS; HIGH DENSITY; HIGH ENERGY; HIGH TEMPERATURE; LATTICE THERMAL CONDUCTIVITY; MATRIX; POWDER X RAY DIFFRACTION; PRESSED PELLETS; RISING TEMPERATURES; SEMICONDUCTING BEHAVIOR; SHAKER MILLS; SHARP INCREASE; SOLID-STATE TECHNIQUES; SYNTHESIZED MATERIALS; TEMPERATURE RANGE; THERMOELECTRIC PROPERTIES; THERMOPOWERS;

ALLOYS; ELECTRIC CONDUCTIVITY; HAFNIUM; INCLUSIONS; MECHANICAL ALLOYING; PALLADIUM; SEMICONDUCTOR GROWTH; THERMOELECTRIC EQUIPMENT; THERMOELECTRICITY; TIN; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; ZIRCONIUM;

TIN ALLOYS;

EID: 78650366925     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

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