A SAXS study of hydrogenated nanocrystalline silicon thin films

Materials Research Society Symposium Proceedings

Volumn 1245, Issue , 2010, Pages 271-275

  Kiriluk, K G ^a   Williamson, D L ^a   Bobela, D C ^b   Taylor, P C ^a   Yan, B ^c   Yang, J ^c   Guha, S ^c   Madan, A ^d   Zhu, F ^d  

^a Department of Geology and Geological Engineering   (United States)

^b NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

^c UNITED SOLAR OVONIC LLC   (United States)

^d MVSystems Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLITE SIZE; HYDROGENATION; NANOCRYSTALLINE SILICON; NANOCRYSTALS; THIN FILMS; X RAY DIFFRACTION; X RAY SCATTERING;

BOND RECONSTRUCTION; CRYSTALLITE SURFACES; ELECTRON DENSITY FLUCTUATIONS; ELLIPSOIDAL-SHAPED; GROWTH DIRECTIONS; HYDROGENATED NANOCRYSTALLINE SILICON (NC-SI:H); HYDROGENATED NANOCRYSTALLINE SILICON THIN FILM; SCATTERING CENTERS;

AMORPHOUS SILICON;

EID: 78650366453     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-1245-a13-02     Document Type: Conference Paper

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