Overview of advanced 3D charge-trapping flash memory devices

Materials Research Society Symposium Proceedings

Volumn 1250, Issue , 2010, Pages 17-22

  Lue, Hang Ting ^a   Hsieh, Kuang Yeu ^a   Lu, Chih Yuan ^a  

^a MACRONIX INTERNATIONAL CO LTD   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE TRAPPING; FIELD EFFECT TRANSISTORS; MEMORY ARCHITECTURE; STATISTICAL MECHANICS; THIN FILM TRANSISTORS; THREE DIMENSIONAL INTEGRATED CIRCUITS;

CHARGE STORAGE; CHARGE-TRAPPING FLASHES; ELECTRON STORAGE; FLOATING GATES; SCALABLE APPROACH; SHORT-CHANNEL EFFECT; STATISTICAL FLUCTUATIONS; TECHNOLOGY CHALLENGES;

FLASH MEMORY;

EID: 78650357366     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-1250-g01-10     Document Type: Conference Paper

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