High resolution crop surface models (CSM) and crop volume models (CVM) on field level by terrestrial laser scanning

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7840, Issue , 2010, Pages

  Hoffmeister, Dirk ^a   Bolten, Andreas ^a   Curdt, Constanze ^a   Waldhoff, Guido ^a   Bareth, Georg ^a  

^a UNIVERSITY OF COLOGNE   (Germany)

Author keywords

Accuracy; Agriculture; Crop; LIDAR; Modelling; Parameters; Surface; TLS

Indexed keywords

ACCURACY; LIDAR; MODELLING; PARAMETERS; TLS;

ALGORITHMS; ATMOSPHERIC BOUNDARY LAYER; CROPS; GEOLOGIC MODELS; LASER APPLICATIONS; MATHEMATICAL MODELS; OPTICAL RADAR; PARAMETER ESTIMATION; RESEARCH; SCANNING; SENSORS; SOILS; STEEL BEAMS AND GIRDERS; SUGAR (SUCROSE); SUGAR BEETS; TROPOSPHERE; VIRTUAL REALITY;

SURVEYING INSTRUMENTS;

EID: 78650340818     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.872315     Document Type: Conference Paper

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