|
Volumn 81, Issue 11, 2010, Pages
|
Optical temperature measurements on thin freestanding silicon membranes
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ALL-OPTICAL;
CONTACT LESS;
FIRST ORDER;
FOCUSED ION BEAM MILLING;
HEAT DIFFUSIONS;
MILLIKELVIN;
NANOSTRUCTURED MEMBRANES;
OPTICAL TRANSMISSIVITY;
SILICON MEMBRANES;
TEMPERATURE DEPENDENT;
TEMPORAL RESOLUTION;
THERMAL PROPERTIES;
TRANSIENT THERMAL GRATING;
TEMPERATURE MEASUREMENT;
THERMODYNAMIC PROPERTIES;
MEMBRANES;
|
EID: 78650268753
PISSN: 00346748
EISSN: None
Source Type: Journal
DOI: 10.1063/1.3499503 Document Type: Article |
Times cited : (17)
|
References (7)
|