메뉴 건너뛰기




Volumn 81, Issue 11, 2010, Pages

Optical temperature measurements on thin freestanding silicon membranes

Author keywords

[No Author keywords available]

Indexed keywords

ALL-OPTICAL; CONTACT LESS; FIRST ORDER; FOCUSED ION BEAM MILLING; HEAT DIFFUSIONS; MILLIKELVIN; NANOSTRUCTURED MEMBRANES; OPTICAL TRANSMISSIVITY; SILICON MEMBRANES; TEMPERATURE DEPENDENT; TEMPORAL RESOLUTION; THERMAL PROPERTIES; TRANSIENT THERMAL GRATING;

EID: 78650268753     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3499503     Document Type: Article
Times cited : (17)

References (7)
  • 2
    • 0000878614 scopus 로고
    • JAPIAU 0021-8979,. 10.1063/1.337386
    • G. Jellison and H. Burke, J. Appl. Phys. JAPIAU 0021-8979 60, 841 (1986). 10.1063/1.337386
    • (1986) J. Appl. Phys. , vol.60 , pp. 841
    • Jellison, G.1    Burke, H.2
  • 5
    • 33847596250 scopus 로고
    • PLRBAQ 0556-2805,. 10.1103/PhysRevB.27.985
    • D. E. Aspnes and A. A. Studna, Phys. Rev. B PLRBAQ 0556-2805 27, 985 (1983). 10.1103/PhysRevB.27.985
    • (1983) Phys. Rev. B , vol.27 , pp. 985
    • Aspnes, D.E.1    Studna, A.A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.