Carrier-depletion in the stripe-length method: Consequences for gain measurement

Journal of Applied Physics

Volumn 108, Issue 10, 2010, Pages

  Lange, C ^a   Schwalm, M ^a   Metzger, B ^a   Chatterjee, S ^a  

^a PHILIPPS UNIVERSITY MARBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER DEPLETION; OPTICAL MATERIAL GAIN;

EID: 78650260355     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3504222     Document Type: Conference Paper

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