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Volumn 81, Issue 11, 2010, Pages

Determining concentration depth profiles of thin foam films with neutral impact collision ion scattering spectroscopy

Author keywords

[No Author keywords available]

Indexed keywords

BULK SOLUTIONS; BULK SURFACES; CHARGE SEPARATIONS; CONCENTRATION-DEPTH PROFILE; FOAM FILMS; HEXADECYL TRIMETHYL AMMONIUM BROMIDE; ION SCATTERING; NEUTRAL IMPACT COLLISION; PRESSURE CELL; THIN FOAM FILMS;

EID: 78650259859     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3491736     Document Type: Article
Times cited : (13)

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    • See supplementary material at E-RSINAK-81-001010 for a photograph of the pressure cell used
    • See supplementary material at http://dx.doi.org/10.1063/1.3491736 E-RSINAK-81-001010 for a photograph of the pressure cell used.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.