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Volumn 354, Issue 1, 2011, Pages 405-409

TIRF microscopy as a screening method for non-specific binding on surfaces

Author keywords

Fluorescence; Microscopy; Non specific binding; Surface particle interaction; Total internal reflection

Indexed keywords

AMINOSILANES; BINDING EVENTS; CHEMICAL COMPOSITIONS; FLUORESCENT NANOPARTICLES; FUNCTIONALIZED; HIGH DENSITY; HIGH THROUGHPUT SCREENING; MICROSCOPY; NEGATIVE SURFACE CHARGES; NON-SPECIFIC BINDING; NONSPECIFIC ADSORPTION; SCREENING METHODS; SURFACE GROUPS; SURFACE INTERACTIONS; TIRF MICROSCOPY; TOTAL INTERNAL REFLECTION FLUORESCENCE MICROSCOPY; TOTAL INTERNAL REFLECTIONS;

EID: 78650170914     PISSN: 00219797     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcis.2010.10.029     Document Type: Article
Times cited : (10)

References (24)
  • 22
    • 78650177784 scopus 로고    scopus 로고
    • et al., Patent and manuscript in preparation.
    • C. Coyle et al., Patent and manuscript in preparation.
    • Coyle, C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.