Rating of annual energy yield more sensitive to reference power than module technology

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2010, Pages 1095-1099

  Zinßer, Bastian ^a   Makrides, George ^b   Schubert, Markus B ^a   Georghiou, George E ^b   Wemer, Jurgen H ^a  

^a UNIVERSITY OF STUTTGART   (Germany)

^b UNIVERSITY OF CYPRUS   (Cyprus)

Author keywords

[No Author keywords available]

Indexed keywords

CLIMATIC CONDITIONS; ENERGY MEASUREMENTS; ENERGY YIELDS; ERROR BARS; GERMANY; KNOW-HOW; LOW LIGHT; MEASURED FIELD; PERFORMANCE ANALYSIS; PHOTOVOLTAIC TECHNOLOGY; POWER RATINGS; PV MODULES; PV SYSTEM; TEMPERATURE DEPENDENCIES;

ERROR ANALYSIS; PHOTOVOLTAIC EFFECTS; RATING;

TECHNOLOGY;

EID: 78650166834     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2010.5614705     Document Type: Conference Paper

References (9)

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