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Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2010, Pages 1937-1942

Interface analysis in CdTe/CdS solar cells

(10) Lita, B a Pavol, M J a Dovidenko, K b Le Tarte, L A b Ellis, D b Barbuto, T b Bansal, S b Smentkowski, V S b Young, M c Asher, S E c

a PrimeStar Solar (United States)

b GENERAL ELECTRIC COMPANY (United States)

c NATIONAL RENEWABLE ENERGY LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AES DEPTH PROFILING; ALTERNATIVE METHODS; BURIED INTERFACE; CDS; CDTE; CDTE SOLAR CELLS; CDTE/CDS; CHEMICAL COMPOSITION ANALYSIS; CHEMICAL ETCHING; INTER-DIFFUSION; INTERFACE ANALYSIS; INTERFACE ROUGHNESS; MECHANICAL POLISHING; OUT-DIFFUSION; SAMPLE PREPARATION; SAMPLE PREPARATION METHODS; TEMPERATURE DEPENDENT;

AUGER ELECTRON SPECTROSCOPY; CADMIUM ALLOYS; CADMIUM COMPOUNDS; CADMIUM SULFIDE; CHEMICAL MECHANICAL POLISHING; CHEMICAL POLISHING; DEPTH PROFILING; PHOTOVOLTAIC EFFECTS; SCANNING ELECTRON MICROSCOPY; SECONDARY ION MASS SPECTROMETRY; SOLAR CELLS;

CHEMICAL ANALYSIS;

EID: 78650166806 PISSN: 01608371 EISSN: None Source Type: Conference Proceeding
DOI: 10.1109/PVSC.2010.5616219 Document Type: Conference Paper

Times cited : (1)

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