Reducing configurations to monitor in a software product line

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

Volumn 6418 LNCS, Issue , 2010, Pages 285-299

  Kim, Chang Hwan Peter ^a   Bodden, Eric ^b   Batory, Don ^a   Khurshid, Sarfraz ^a  

^a University of Texas at Austin   (United States)

^b DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EXECUTION MONITORING; FEATURE COMBINATION; MONITORING TECHNIQUES; PRODUCT-LINES; SAFETY PROPERTY; SOFTWARE PRODUCT LINE;

MONITORING; COMPUTER SOFTWARE;

MONITORING;

EID: 78650134566     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/978-3-642-16612-9_22     Document Type: Conference Paper

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