Nonlinear dark-field microscopy

Nano Letters

Volumn 10, Issue 12, 2010, Pages 5076-5079

  Harutyunyan, Hayk ^a   Palomba, Stefano ^a   Renger, Jan ^b   Quidant, Romain ^b,c   Novotny, Lukas ^a  

^a UNIVERSITY OF ROCHESTER   (United States)

^b ICFO INSTITUT DE CIENCIES FOTONIQUES   (Spain)

^c INSTITUCIÓ CATALANA DE RECERCA I ESTUDIS AVANÇATS ICREA   (Spain)

Author keywords

Dark field imaging; detection and failure analysis; microscopy; nonlinear wave mixing; optical sensing

Indexed keywords

DARK FIELD IMAGING; DETECTION AND FAILURE ANALYSIS; MICROSCOPY; NONLINEAR WAVE MIXING; OPTICAL SENSING;

BIOLOGICAL MATERIALS; FOUR WAVE MIXING; NONLINEAR ANALYSIS; QUALITY ASSURANCE; SIGNAL DETECTION; SIGNAL TO NOISE RATIO; WAVES;

FAILURE ANALYSIS;

EID: 78650099761     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl1033304     Document Type: Article

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