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Volumn , Issue , 2010, Pages 935-941

Characterization of a modified LISN for effective separated measurements of common mode and differential mode EMI noise

Author keywords

Characterization of noise separation; Common mode (cm); Differential mode (dm); EMC; EMI; LISN; Noise separation

Indexed keywords

COMMONMODE; DIFFERENTIAL MODE (DM); EMC; EMI; LISN; NOISE SEPARATION;

EID: 78650079853     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECCE.2010.5617888     Document Type: Conference Paper
Times cited : (25)

References (13)
  • 1
    • 18844457716 scopus 로고
    • Test method to differentiate common mode and differential mode noise
    • A. A. Toppeto: "Test method to differentiate common mode and differential mode noise". IEEE Proc. EMC Symp., pp. 497-502, 1979.
    • (1979) IEEE Proc. EMC Symp. , pp. 497-502
    • Toppeto, A.A.1
  • 2
    • 0030151736 scopus 로고    scopus 로고
    • Separation of the common-mode- and differential-mode-conducted EMI noise
    • PII S088589939603548X
    • T. Guo, D. Y. Chen, F. C. Lee: "Separation of the common-mode- and differential-mode-conducted EMI noise". IEEE Transactions on Power Electronics, Vol. 11, No. 3, pp. 480-488, May 1996. (Pubitemid 126774106)
    • (1996) IEEE Transactions on Power Electronics , vol.11 , Issue.3 , pp. 480-488
    • Guo, T.1    Chen, D.Y.2    Lee, F.C.3
  • 3
  • 4
    • 0034247192 scopus 로고    scopus 로고
    • A software-based cm and dm measurement system for the conducted EMI
    • August
    • Y.-K. Lo, H.-J. Chiu, T.-H. Song: "A software-based cm and dm measurement system for the conducted EMI". IEEE Transactions on Industrial Electronics, Vol. 47, No. 4, pp. 977-978, August 2000.
    • (2000) IEEE Transactions on Industrial Electronics , vol.47 , Issue.4 , pp. 977-978
    • Lo, Y.-K.1    Chiu, H.-J.2    Song, T.-H.3
  • 5
    • 78650087995 scopus 로고    scopus 로고
    • Industrie-Schaltnetzgeräte im Test. Teil 3: Elektromagnetische Verträglichkeit
    • October
    • A. Bucher, M. Albach, T. Duerbaum, D. Kuebrich: "Industrie- Schaltnetzgeräte im Test. Teil 3: elektromagnetische Verträ glichkeit". Journal: Elektronik, pp. 86-90, October 2007.
    • (2007) Journal: Elektronik , pp. 86-90
    • Bucher, A.1    Albach, M.2    Duerbaum, T.3    Kuebrich, D.4
  • 6
    • 34948830624 scopus 로고    scopus 로고
    • Software-based separation of conductive EMI signals
    • DOI 10.1109/IAS.2006.256685, 4025372, Conference Record of the 2006 IEEE Industry Applications Conference - Forty-First IAS Annual Meeting
    • P.-S. Chen, Y.-S. Lai: "Software-based separation of conductive EMI signals". IEEE, IAS Annual Meeting Industry Applications Conference Record, Vol. 3, pp. 1209-1214, 2006. (Pubitemid 47514765)
    • (2006) Conference Record - IAS Annual Meeting (IEEE Industry Applications Society) , vol.3 , pp. 1209-1214
    • Chen, P.-S.1    Lai, Y.-S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.