The Accelerated Failure Time Model Under Biased Sampling

Biometrics

Volumn 66, Issue 4, 2010, Pages 1306-1308

  Mandel, Micha ^a   Ritov, Ya'akov ^a  

^a HEBREW UNIVERSITY OF JERUSALEM   (Israel)

Author keywords

Length bias; Size bias; Survival; Weighted distribution

Indexed keywords

BIASED SAMPLING; CENSORED OBSERVATIONS; ESTIMATION METHODS; FAILURE TIME; LENGTH BIAS; SEMIPARAMETRIC; SIZE BIAS; SURVIVAL; TIME MODELING; WEIGHTED DISTRIBUTION;

BIOMETRICS; SAFETY ENGINEERING;

ESTIMATION METHOD; FAILURE ANALYSIS; HAZARD ASSESSMENT; REGRESSION ANALYSIS; SAMPLING; SURVIVAL; TEMPORAL ANALYSIS; NUMERICAL MODEL;

EID: 78650046727     PISSN: 0006341X     EISSN: 15410420     Source Type: Journal    
DOI: 10.1111/j.1541-0420.2009.01366_1.x     Document Type: Article

References (5)

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