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Volumn , Issue , 2010, Pages 1754-1757
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A testbed for precision impedance measurements of planar symmetrical RFID antennas
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Author keywords
[No Author keywords available]
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Indexed keywords
COMMONLY USED;
IMPEDANCE ANALYZER;
IMPEDANCE MEASUREMENT;
MEASUREMENT RESULTS;
MEASUREMENT SETUP;
SIMULATION AND MEASUREMENT;
WAFER PROBERS;
WAFER PROBES;
MICROWAVES;
PROBES;
TEST FACILITIES;
TESTBEDS;
ANTENNAS;
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EID: 78650044326
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (3)
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References (4)
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