Structural and microwave dielectric behavior of (Li1/4Nb 3/4) substituted ZrxSnyTizO 4 (x + y + z = 2) system

Materials Chemistry and Physics

Volumn 125, Issue 3, 2011, Pages 641-645

  Pang, Li Xia ^a,b   Zhou, Di ^b   Chen, Yue Hua ^b   Wang, Hong ^b  

^a XI'AN TECHNOLOGICAL UNIVERSITY   (China)

^b XI'AN JIAOTONG UNIVERSITY   (China)

Author keywords

Ceramics; Dielectric properties; Electronic materials; Sintering

Indexed keywords

ANNEALING CONDITION; CERAMICS; ELECTRONIC MATERIALS; HIGH TEMPERATURE; MICROWAVE DIELECTRIC PROPERTIES; MICROWAVE DIELECTRICS; SINTERING TEMPERATURES;

CERAMIC MATERIALS; DIELECTRIC MATERIALS; DIFFRACTION; MATERIALS PROPERTIES; PERMITTIVITY; PHASE STRUCTURE; SINTERING; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; ZIRCONIUM;

TIN;

EID: 78649995090     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2010.10.005     Document Type: Article

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