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Volumn 27, Issue 12, 2010, Pages 2727-2730

Spectral ripple effect in continuous-wave fold-type cavity ring down spectroscopy

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; GLASS CERAMICS; MIRRORS; REFLECTION;

EID: 78649960964     PISSN: 07403224     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAB.27.002727     Document Type: Article
Times cited : (16)

References (16)
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  • 4
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    • Response of a ring-down cavity to an arbitrary excitation
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  • 7
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    • Cavity ring-down optical spectrometer for absorption measurements using pulsed laser Sources
    • A. O'Keefe and D. A. G. Deacon, "Cavity ring-down optical spectrometer for absorption measurements using pulsed laser Sources," Rev. Sci. Instrum. 59, 2544-2554 (1988).
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    • O'keefe, A.1    Deacon, D.A.G.2
  • 9
    • 34547157102 scopus 로고    scopus 로고
    • Noise in cavity ring-down spectroscopy caused by transverse mode coupling
    • H. Huang and K. Lehmann, "Noise in cavity ring-down spectroscopy caused by transverse mode coupling," Opt. Express 15, 8745-8759 (2007).
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    • Huang, H.1    Lehmann, K.2
  • 10
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    • Measurement of trace gases by diode laser cavity ringdown spectroscopy
    • D. Romanini, A. A. Kachanov, J. Morville, and M. Chenevier, "Measurement of trace gases by diode laser cavity ringdown spectroscopy," Proc. SPIE 3821, 94-104 (1999).
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  • 11
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    • Two schemes for trace detection using cavity ringdown spectroscopy
    • J. Morville, D. Romanini, A. A. Kachanov, and M. Chenevier, "Two schemes for trace detection using cavity ringdown spectroscopy," Appl. Phys. B 78, 465-476 (2004).
    • (2004) Appl. Phys. B , vol.78 , pp. 465-476
    • Morville, J.1    Romanini, D.2    Kachanov, A.A.3    Chenevier, M.4
  • 12
    • 0021406864 scopus 로고
    • Mirror reflectometer based on optical cavity decay time
    • D. Z. Anderson, F. C. Josef, and C. S. Masser, "Mirror reflectometer based on optical cavity decay time," Appl. Opt. 23, 1238-1245 (1984).
    • (1984) Appl. Opt. , vol.23 , pp. 1238-1245
    • Anderson, D.Z.1    Josef, F.C.2    Masser, C.S.3
  • 14
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    • Effects of interface roughness on the spectral properties of thin films and multilayers
    • A. V. Tikhonravov, M. K. Trubetskov, A. A. Tikhonravov, and A. Duparre, "Effects of interface roughness on the spectral properties of thin films and multilayers," Appl. Opt. 42, 5140-5148 (2003).
    • (2003) Appl. Opt. , vol.42 , pp. 5140-5148
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  • 15
    • 84975538355 scopus 로고
    • Measurement of ultralow losses in an optical interferometer
    • G. Rempe, R. J. Thompson, and H. J. Kimble, "Measurement of ultralow losses in an optical interferometer," Opt. Lett. 17, 363-365 (1992).
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  • 16
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    • Absorptance behavior of optical coatings for high-average-power laser applications
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.