Vector magnetometry in ultrathin magnetic structures with atomic layer resolution by polarized neutron reflection

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 15, Issue 3, 1997, Pages 1759-1765

  Bland, J A C ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED FIELD; ATOMIC LAYER; ATOMIC SCALE; CIRCULAR DICHROISM; DIFFUSE SCATTERING; INTERFACE ROUGHNESS; LAYER THICKNESS; MAGNETIC MOMENT ORIENTATIONS; MAGNETIZATION PROFILE; MOMENT DISTRIBUTION; NONMAGNETICS; POLARIZED NEUTRON REFLECTIONS; SPIN MOMENTS; SPIN ORIENTATIONS; SPIN VALVE STRUCTURE; STRUCTURAL DISORDERS; SUM RULE; SUPERCONDUCTING QUANTUM INTERFERENCE DEVICE MAGNETOMETRY; TEST SAMPLES; THEORETICAL CALCULATIONS; THICKNESS DEPENDENCE; THIN-FILM STRUCTURE; TRILAYER STRUCTURE; ULTRA-THIN; VECTOR MAGNETOMETRY; WAVE VECTOR; X-RAY REFLECTIVITY MEASUREMENTS;

ATOMS; DICHROISM; EPITAXIAL GROWTH; FILM PREPARATION; INTERFACES (MATERIALS); MAGNETIC DEVICES; MAGNETIC MOMENTS; MAGNETIC THIN FILMS; MAGNETIZATION; MAGNETOMETERS; MOLECULAR BEAM EPITAXY; MOLECULAR BEAMS; NEUTRON REFLECTION; PALLADIUM; REFLECTION; SQUIDS;

MEASUREMENTS;

EID: 78649951805     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.580865     Document Type: Article

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