X-ray microtomography

Materials Characterization

Volumn 61, Issue 12, 2010, Pages 1305-1316

  Landis, Eric N ^a   Keane, Denis T ^b,c  

^a University of Maine   (United States)

^b NORTHWESTERN UNIVERSITY   (United States)

^c ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

3D image processing; Microtomography; X ray computed tomography

Indexed keywords

CHARACTERIZATION; COMPUTERIZED TOMOGRAPHY; IMAGE PROCESSING; IMAGING SYSTEMS;

3-D IMAGE PROCESSING; MATERIAL MICROSTRUCTURES; MICRO-TOMOGRAPHY; MONOCHROMATIC X RAY BEAMS; THREE DIMENSIONAL IMAGES; THREE-DIMENSIONAL IMAGE PROCESSING; X RAY MICROTOMOGRAPHY; X-RAY COMPUTED TOMOGRAPHY;

X RAYS;

EID: 78649938829     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchar.2010.09.012     Document Type: Short Survey

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