High energy electron climatology that supports deep charging risk assessment in GEO

48th AIAA Aerospace Sciences Meeting Including the New Horizons Forum and Aerospace Exposition

Volumn , Issue , 2010, Pages

  Bodeau, Michael ^a  

^a Northrop Grumman Aerospace Systems   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONS; ELECTROSTATIC DEVICES; NASA; RADIATION EFFECTS; RISK ASSESSMENT;

ELECTRON FLUENCES; EQUIVALENT TIME; EXTERNAL ELECTRONS; EXTERNAL ENVIRONMENTS; FLIGHT EXPERIMENTS; GEOSYNCHRONOUS ORBITS; HIGH-ENERGY ELECTRON; INTERNAL CHARGING;

ORBITS;

EID: 78649880928     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.2514/6.2010-1608     Document Type: Conference Paper

References (42)

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3. th Spacecraft Charging Technology Conference, AFRL-VS-TR- 20001578, 1 September 2000.
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