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Volumn , Issue , 2000, Pages 765-768
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Intense UV-visible photoluminescence from Si+ and N+ co-implanted thermal SiO2 films
a a a a a a b b b b b |
Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRON SPIN RESONANCE;
IMPLANTED IONS;
PL BANDS;
ROOM TEMPERATURE;
SI IONS;
UV-VISIBLE;
ELECTRON SPIN RESONANCE SPECTROSCOPY;
ION IMPLANTATION;
PHOTOLUMINESCENCE;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
SILICON COMPOUNDS;
SPIN DYNAMICS;
SILICON;
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EID: 78649876206
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/.2000.924266 Document Type: Conference Paper |
Times cited : (3)
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References (5)
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