|
Volumn 22, Issue 50, 2010, Pages
|
Determination of atomic site susceptibility tensors from neutron diffraction data on polycrystalline samples
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ATOMIC DISPLACEMENT PARAMETERS;
ATOMIC SITES;
ATOMIC SUSCEPTIBILITY;
EXTERNAL MAGNETIC FIELD;
FLIPPING RATIOS;
MAGNETIC RESPONSE;
MAGNETIC SITES;
NEUTRON DIFFRACTION DATA;
NEUTRON DIFFRACTION MEASUREMENTS;
POLARIZED NEUTRON DIFFRACTION;
POLARIZED NEUTRONS;
POLYCRYSTALLINE SAMPLES;
POWDER SAMPLES;
SUSCEPTIBILITY TENSORS;
THERMAL ELLIPSOIDS;
ATOMS;
MAGNETIC FIELDS;
MAGNETIC SUSCEPTIBILITY;
NEUTRON DIFFRACTION;
NEUTRONS;
SINGLE CRYSTALS;
TENSORS;
TIN;
TERBIUM;
|
EID: 78649872561
PISSN: 09538984
EISSN: 1361648X
Source Type: Journal
DOI: 10.1088/0953-8984/22/50/502201 Document Type: Article |
Times cited : (15)
|
References (14)
|