|
Volumn 7802, Issue , 2010, Pages
|
Beam coherence and X-ray windows
a a a a a a |
Author keywords
Coherence; Polish; Single crystal; Window; X ray
|
Indexed keywords
BEAM COHERENCE;
BEAM-LINES;
COHERENCE;
EXPERIMENTAL ENVIRONMENT;
HIGH PURITY;
POLISH;
STRUCTURAL PERFECTION;
TRANSMITTED BEAMS;
WINDOW MATERIALS;
X RAY BEAM;
X-RAY BEAM QUALITIES;
X-RAY SYNCHROTRON;
X-RAY WINDOW;
BERYLLIUM;
SILICON NITRIDE;
SINGLE CRYSTALS;
SURFACE ROUGHNESS;
X RAYS;
PHOTODEGRADATION;
|
EID: 78649838808
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.877449 Document Type: Conference Paper |
Times cited : (2)
|
References (3)
|