Specimen preparation for electron diffraction of thin crystals

Micron

Volumn 42, Issue 2, 2011, Pages 132-140

  Wang, Huaibin ^a   Downing, Kenneth H ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

Diffraction; Electron crystallography; Protein structure; Specimen preparation

Indexed keywords

ATOMIC RESOLUTION; DATA COLLECTION PROTOCOLS; DEGREE OF ORDER; DIFFRACTION SPOTS; ELECTRON CRYSTALLOGRAPHIC DATA; ELECTRON CRYSTALLOGRAPHY; ELECTRON DIFFRACTION DATA; HIGH RESOLUTION; HIGH TILT ANGLE; NATIVE STATE; ORGANIC MOLECULES; PROTEIN CRYSTAL; PROTEIN STRUCTURE; PROTEIN STRUCTURES; SPECIMEN PREPARATION METHOD; STRUCTURAL CHARACTERIZATION; STRUCTURAL INFORMATION; THIN CRYSTAL;

CRYSTAL ATOMIC STRUCTURE; CRYSTALLOGRAPHY; CRYSTALS; DATA ACQUISITION; ELECTRON DIFFRACTION; ELECTRONS; MINERALOGY; PROTEINS;

SPECIMEN PREPARATION;

PROTEIN;

CHEMISTRY; CRYSTALLIZATION; HISTOLOGY; REVIEW; TRANSMISSION ELECTRON MICROSCOPY;

CRYSTALLIZATION; HISTOCYTOLOGICAL PREPARATION TECHNIQUES; MICROSCOPY, ELECTRON, TRANSMISSION; PROTEINS;

EID: 78649807389     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2010.05.003     Document Type: Review

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