Towards identifying software project clusters with regard to defect prediction

ACM International Conference Proceeding Series

Volumn , Issue , 2010, Pages

  Jureczko, Marian ^a   Madeyski, Lech ^a  

^a WROCLAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Clustering; Defect prediction; Design metrics; Size metrics

Indexed keywords

ACADEMIC PROJECTS; BELONG TO; CLUSTERING; DEFECT PREDICTION; DEFECT PREDICTION MODELS; DESIGN METRICS; EFFECT SIZE; IN-DEPTH ANALYSIS; K-MEANS CLUSTERING; KOHONEN'S NEURAL NETWORKS; MEAN VALUES; MODEL-BASED; OPEN-SOURCE; SIZE METRICS; SOFTWARE PROJECT; STATISTICAL ANALYSIS;

DEFECTS; DISCRIMINANT ANALYSIS; FORMAL METHODS; MATHEMATICAL MODELS; MODELS; NEURAL NETWORKS; PREDICTIVE CONTROL SYSTEMS; STATISTICAL TESTS;

FORECASTING;

EID: 78649783178     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1868328.1868342     Document Type: Conference Paper

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