Deviance from perfection is a better criterion than closeness to evil when identifying risky code

ASE'10 - Proceedings of the IEEE/ACM International Conference on Automated Software Engineering

Volumn , Issue , 2010, Pages 113-122

  Kessentini, Marouane ^a   Vaucher, Stéphane ^a   Sahraoui, Houari ^a  

^a UNIVERSITÉ DE MONTRÉAL   (Canada)

Author keywords

Artificial immune systems; Design defects; Maintenance

Indexed keywords

ARTIFICIAL IMMUNE SYSTEM; AUTOMATIC DETECTION; DESIGN DEFECTS; GOOD PRACTICES; JHOTDRAW; OPEN SOURCE SYSTEM; POTENTIAL DEFECTS; RULE-BASED APPROACH; STATE OF THE ART;

COMPUTER SOFTWARE MAINTENANCE; DESIGN; DETECTORS; IMMUNOLOGY; SOFTWARE ENGINEERING;

DEFECTS;

EID: 78649773557     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1858996.1859015     Document Type: Conference Paper

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