Brightly luminescent organically capped silicon nanocrystals fabricated at room temperature and atmospheric pressure

ACS Nano

Volumn 4, Issue 8, 2010, Pages 4495-4504

  Kůsová, Kateřina ^a   Cibulka, Ondřej ^a   Dohnalová, Kateřina ^a,f   Pelant, Ivan ^a   Valenta, Jan ^b   Fǔcíková, Anna ^a,b   Žídek, Karel ^a,b   Lang, Jan ^b   Englich, Jiří ^b   Matějka, Pavel ^c   Štěpánek, Petr ^d   Bakardjieva, Snejana ^e  

^a INSTITUTE OF PHYSICS   (Czech Republic)

^b CHARLES UNIVERSITY   (Czech Republic)

^c INSTITUTE OF CHEMICAL TECHNOLOGY   (Czech Republic)

^d INSTITUTE OF MACROMOLECULAR CHEMISTRY   (Czech Republic)

^e INSTITUTE OF INORGANIC CHEMISTRY   (Czech Republic)

^f UNIVERSITY OF AMSTERDAM   (Netherlands)

Author keywords

NMR; Organic capping; Photoluminescence; Silicon nanocrystals; Single nanocrystal spectroscopy

Indexed keywords

AMBIENT PRESSURES; BOTH FOURIER TRANSFORM INFRARED; COLLOIDAL DISPERSION; DIRECT BAND GAP; DIRECT BAND GAP SEMICONDUCTORS; FINE STRUCTURES; INTRINSIC PROPERTY; LIGHT EMITTING MATERIALS; NMR; OPTICALLY CLEAR; ORGANIC CAPPING; ORGANIC RESIDUES; PHOTOLUMINESCENCE QUANTUM EFFICIENCY; RADIATIVE LIFETIME; ROOM TEMPERATURE; SEMICONDUCTOR NANOCRYSTALS; SI NANOCRYSTAL; SILICON NANOCRYSTALS; SILICON-BASED TECHNOLOGY; SURFACE PASSIVATION;

ATMOSPHERIC PRESSURE; ATMOSPHERIC TEMPERATURE; BIOCOMPATIBILITY; ENERGY GAP; FOURIER TRANSFORM INFRARED SPECTROSCOPY; FOURIER TRANSFORMS; NANOPARTICLES; NUCLEAR MAGNETIC RESONANCE; NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY; OPTICAL PROPERTIES; PASSIVATION; PHOTOLUMINESCENCE; RESONANCE; SILICON COMPOUNDS; SILICON OXIDES;

NANOCRYSTALS;

NANOPARTICLE; SILICON;

ARTICLE; ATMOSPHERIC PRESSURE; CHEMISTRY; COLLOID; INFRARED SPECTROSCOPY; LIGHT; LUMINESCENCE; METHODOLOGY; NANOTECHNOLOGY; NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY; RADIATION SCATTERING; SURFACE PROPERTY; TEMPERATURE; TRANSMISSION ELECTRON MICROSCOPY;

ATMOSPHERIC PRESSURE; COLLOIDS; LIGHT; LUMINESCENT MEASUREMENTS; MAGNETIC RESONANCE SPECTROSCOPY; MICROSCOPY, ELECTRON, TRANSMISSION; NANOPARTICLES; NANOTECHNOLOGY; SCATTERING, RADIATION; SILICON; SPECTROSCOPY, FOURIER TRANSFORM INFRARED; SURFACE PROPERTIES; TEMPERATURE;

EID: 78649699313     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn1005182     Document Type: Article

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