Cross-sectional TEM study and film thickness dependence of Tc in heavily boron-doped superconducting diamond

Physica C: Superconductivity and its Applications

Volumn 470, Issue SUPPL.1, 2010, Pages

  Kitagoh, S ^a   Okada, R ^a   Kawano, A ^a   Watanabe, M ^a   Takano, Y ^b   Yamaguchi, T ^b   Chikyow, T ^a,b   Kawarada, H ^a  

^a WASEDA UNIVERSITY   (Japan)

^b NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

Boron doped; Crystalline structure; Diamond; Superconductivity; Thin film

Indexed keywords

BORON-DOPED; CROSS-SECTIONAL TEM; CRYSTALLINE STRUCTURE; DEFECTIVE STRUCTURES; DOPED DIAMONDS; HOMOEPITAXIAL LAYERS; SUPERCONDUCTING TRANSITIONS; THICKNESS DEPENDENCE; TRANSMISSION ELECTRON MICROSCOPE;

BORON; CRYSTALLINE MATERIALS; DIAMONDS; SUPERCONDUCTIVITY; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

SUPERCONDUCTING FILMS;

EID: 78649694561     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physc.2009.12.064     Document Type: Conference Paper

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