Integrated diagnostic/prognostic experimental setup for capacitor degradation and health monitoring

AUTOTESTCON (Proceedings)

Volumn , Issue , 2010, Pages 351-357

  Kulkarni, Chetan ^a   Biswas, Gautam ^a   Koutsoukos, Xenofon ^a   Celaya, Jose ^b   Goebel, Kai ^b  

^a VANDERBILT UNIVERSITY   (United States)

^b NASA AMES RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADVERSE EFFECT; CONVERTER SYSTEM; DC-DC POWER CONVERTER; DOWNSTREAM COMPONENTS; EQUIVALENT SERIES RESISTANCE; EXPERIMENTAL ANALYSIS; EXPERIMENTAL SETUP; FAILURE RATE; HEALTH MONITORING; MODEL BASED APPROACH; PHYSICS OF FAILURES; PHYSICS-BASED MODELING; POWER MOSFET; REMAINING USEFUL LIVES; RIPPLE CURRENTS; STOCHASTIC SIMULATIONS; SYSTEMATIC ANALYSIS; WORK FOCUS;

BIODEGRADATION; CAPACITORS; COMPUTER SIMULATION; DC-DC CONVERTERS; DEGRADATION; DIAGNOSIS; ELECTROLYTIC ANALYSIS; HIGH ENERGY PHYSICS; HVDC POWER TRANSMISSION; LIGHT VELOCITY; STOCHASTIC MODELS;

ELECTROLYTIC CAPACITORS;

EID: 78649578093     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/AUTEST.2010.5613596     Document Type: Conference Paper

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