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Applied Physics Letters

Volumn 97, Issue 21, 2010, Pages

Injection and detection of ballistic electrical currents in silicon

(2) Zhao, Hui a Smirl, Arthur L b

a UNIVERSITY OF KANSAS (United States)

b UNIVERSITY OF IOWA (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AVERAGE DISTANCE; CENTER OF MASS; DIFFERENTIAL TRANSMISSION; ELECTRICAL CURRENT; ELECTRONS AND HOLES; FREE CARRIER ABSORPTION; GAAS; INJECTION PROCESS; QUANTUM INTERFERENCE; RELATIVE SHIFT; TEMPORAL RESOLUTION; TIME-SCALES; TWO-PHOTON ABSORPTIONS;

BALLISTICS; MULTIPHOTON PROCESSES; PHOTONS;

ELECTRIC RECTIFIERS;

EID: 78649556470 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3518719 Document Type: Article

Times cited : (8)

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