Shifts from a distant neighboring resonance

Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 82, Issue 5, 2010, Pages

  Horbatsch, M ^a   Hessels, E A ^a  

^a YORK UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH-PRECISION MEASUREMENT; MODEL SYSTEM; PRECISION MEASUREMENT; QUANTUM INTERFERENCE; RESONANT PROCESS; THREE LEVEL ATOMS;

RESONANCE;

EID: 78649555701     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.82.052519     Document Type: Article

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