A general method to determine twinning elements

Journal of Applied Crystallography

Volumn 43, Issue 6, 2010, Pages 1426-1430

  Zhang, Yudong ^a,b   Li, Zongbin ^a   Esling, Claude ^b   Muller, Jacques ^b   Zhao, Xiang ^a   Zuo, Liang ^a  

^a NORTHEASTERN UNIVERSITY   (China)

^b UNIVERSITÉ PAUL VERLAINE METZ   (France)

Author keywords

interface structure; minimum shear; scanning electron microscopy electron backscatter diffraction; transmission electron microscopy; twinning

Indexed keywords

CRYSTALLINE SOLIDS; FUNDAMENTAL THEORY; GENERAL METHOD; INTERFACE STRUCTURES; MINIMUM SHEAR; PHYSICAL PHENOMENA; SCANNING ELECTRON MICROSCOPY/ELECTRON BACKSCATTER DIFFRACTION; SIMPLE METHOD; TWINNING ELEMENTS; TWINNING MODES; TYPE II;

BACKSCATTERING; CRYSTAL STRUCTURE; DIFFRACTION; ELECTRONS; OPTIMIZATION; TRANSMISSION ELECTRON MICROSCOPY;

TWINNING;

EID: 78649522351     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889810037180     Document Type: Article

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