Robust intermediate read-out for deep submicron technology CMOS image sensors

IEEE Sensors Journal

Volumn 8, Issue 3, 2008, Pages 286-294

  Shoushun, Chen ^a   Boussaid, Farid ^b   Bermak, Amine ^a  

^a HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

^b UNIVERSITY OF WESTERN AUSTRALIA   (Australia)

Author keywords

Cmos image sensor; Intermediate read out; Scalability; Spiking pixel

Indexed keywords

AGGRESSIVE SCALING; CMOS IMAGE SENSOR; CMOS TECHNOLOGY; DEEP SUB-MICRON TECHNOLOGY; DEEP-SUBMICRON CMOS TECHNOLOGY; DIGITAL INTERMEDIATES; GRAY CODES; GRAY ENCODING; INTERMEDIATE READ-OUT; MEMORY FUNCTIONS; MOTION DETECTION; MULTI-RESOLUTIONS; PIXEL CIRCUIT; PIXEL DESIGNS; POTENTIAL APPLICATIONS; SCALABILITY ANALYSIS; SPIKING PIXEL; SUPPLY VOLTAGES;

CIRCUIT SIMULATION; CMOS INTEGRATED CIRCUITS; DIGITAL CAMERAS; IMAGE SENSORS; JITTER; SCALABILITY; SENSORS;

PIXELS;

EID: 78649518581     PISSN: 1530437X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSEN.2007.912783     Document Type: Conference Paper

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