Roughness-adaptive 3-D watermarking based on masking effect of surface roughness

IEEE Transactions on Information Forensics and Security

Volumn 5, Issue 4, 2010, Pages 721-733

  Kim, Kwangtaek ^a   Barni, Mauro ^b   Tan, Hong Z ^a  

^a Purdue University   (United States)

^b UNIVERSITY OF SIENA   (Italy)

Author keywords

Masking effect; polygonal mesh; robustness; roughness adaptive 3 D watermarking; surface roughness

Indexed keywords

ADAPTIVE METHODS; DIGITAL WATERMARKING TECHNIQUE; HUMAN EYE; HUMAN SENSITIVITY; HUMAN VISION; MASKING EFFECT; MASKING PROPERTIES; ORIGINAL ALGORITHMS; POLYGONAL MESHES; PSYCHOVISUAL EXPERIMENTS; ROBUSTNESS; ROUGHNESS-ADAPTIVE 3-D WATERMARKING; SURFACE PATCHES; WATERMARK DETECTION; WATERMARK EMBEDDING PROCESS; WATERMARK ROBUSTNESS;

DIGITAL WATERMARKING; EXPERIMENTS; METAL ANALYSIS; SURFACE PROPERTIES; THREE DIMENSIONAL; WATERMARKING;

SURFACE ROUGHNESS;

EID: 78649408303     PISSN: 15566013     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIFS.2010.2068546     Document Type: Article

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