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Volumn 31, Issue 12, 2010, Pages 1740-1751

Corrosion of copper in presence of acetic acid derivatives

Author keywords

Acetic acid derivatives; Corrosion inhibition; Electrodeposition; Limiting current

Indexed keywords

ACID DERIVATIVE; COPPER SURFACE; CORROSION INHIBITION; CORROSION PROCESS; DIFFUSION CONTROLLED; DIMENSIONAL ANALYSIS METHODS; ELECTRODE HEIGHT; ELECTRODE SURFACES; FIXED TEMPERATURE; FLORY-HUGGINS; FREE ENERGY OF ADSORPTION; INHIBITION EFFICIENCY; LANGMUIRS; LIMITING CURRENT; MASS TRANSFER CORRELATION; PROTECTIVE FILMS; RATE OF CORROSIONS; ROTATING CYLINDERS; SCANNING ELECTRON MICROSCOPES; SEM; SPONTANEOUS ADSORPTION;

EID: 78649346151     PISSN: 01932691     EISSN: 15322351     Source Type: Journal    
DOI: 10.1080/01932690903543147     Document Type: Article
Times cited : (10)

References (48)
  • 35
    • 0003922516 scopus 로고
    • 6th ed.; New Delhi: Prentice Hall of India Private Limited
    • Morission, R.T. and Boyed, R.N. (1994) Organic Chemistry; 6th ed.; New Delhi: Prentice Hall of India Private Limited.
    • (1994) Organic Chemistry
    • Morission, R.T.1    Boyed, R.N.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.