Micellization and adsorption of surfactant in a nonpolar liquid in micrometer scale geometries

Applied Physics Letters

Volumn 97, Issue 18, 2010, Pages

  Beunis, F ^a   Strubbe, F ^a   Marescaux, M ^a   Neyts, K ^a   Verschueren, A R M ^b  

^a GHENT UNIVERSITY   (Belgium)

^b PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

BULK SOLUTIONS; ELECTRICAL TRANSIENTS; INVERSE MICELLES; LAYER THICKNESS; LIQUID LAYER; MICRO-SCALES; MICROMETER SCALE; NONPOLAR LIQUIDS; SURFACE ADSORPTION; SURFACTANT CONCENTRATIONS; THIN LAYERS;

ADSORPTION; IONIC CONDUCTION; LIQUIDS; MICELLIZATION;

SURFACE ACTIVE AGENTS;

EID: 78649303256     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3503968     Document Type: Article

References (22)

1. I. F. Blagovidov, V. P. Lapin, G. L. Trofimpva, and G. I. Shor, Chem. Technol. Fuels Oils 0009-4663 7, 439 (1971). 10.1007/BF00716528
2. H. J. Spinelli, Adv. Mater. 0935-9648 10, 1215 (1998). 10.1002/(SICI)1521-4095(199810)10:15<1215::AID-ADMA1215>3.0.CO;2-0
3. I. Chen, J. Mort, and M. A. Machonkin, Langmuir 0743-7463 13, 5036 (1997). 10.1021/la970020n
4. K. A. Pearlstine, J. Imaging Sci. 8750-9237 35, 326 (1991).
5. V. M. B. Moloney, D. Parris, and M. J. Edirisinghe, J. Am. Ceram. Soc. 0002-7820 78, 3225 (1995). 10.1111/j.1151-2916.1995.tb07958.x
6. B. L. Papke and L. M. Robinson, Langmuir 0743-7463 10, 1741 (1994). 10.1021/la00018a021
7. B. Y. Zhu and T. R. Gu, Adv. Colloid Interface Sci. 0001-8686 37, 1 (1991). 10.1016/0001-8686(91)80037-K
8. S. P. Moulik, Curr. Sci. 0011-3891 71, 368 (1996).
9. B. Comiskey, J. D. Albert, H. Yoshizawa, and J. Jacobson, Nature (London) 0028-0836 394, 253 (1998). 10.1038/28349
10. J. S. H. Lee, I. Barbulovic-Nad, Z. Wu, X. Xuan, and D. Li, J. Appl. Phys. 0021-8979 99, 054905 (2006). 10.1063/1.2177428
11. V. Novotny, J. Electrochem. Soc. 0013-4651 133, 1629 (1986). 10.1149/1.2108980
12. R. E. Kornbrekke, I. D. Morrison, and T. Oja, Langmuir 0743-7463 8, 1211 (1992). 10.1021/la00040a032
13. I. D. Morrison, Colloids Surf., A 0927-7757 71, 1 (1993). 10.1016/0927-7757(93)80026-B
14. A. S. Dukhin and P. J. Goetz, J. Electroanal. Chem. 0022-0728 588, 44 (2006). 10.1016/j.jelechem.2005.12.001
15. F. Beunis, F. Strubbe, K. Neyts, and A. R. M. Verschueren, Appl. Phys. Lett. 0003-6951 90, 182103 (2007). 10.1063/1.2734511
16. F. Beunis, F. Strubbe, M. Marescaux, K. Neyts, and A. R. M. Verschueren, Appl. Phys. Lett. 0003-6951 91, 182911 (2007). 10.1063/1.2805229
17. F. Strubbe, A. R. M. Verschueren, L. J. M. Schlangen, F. Beunis, and K. Neyts, J. Colloid Interface Sci. 0021-9797 300, 396 (2006). 10.1016/j.jcis.2006. 03.050
18. S. Jayaram and J. D. Cross, J. Electrost. 0304-3886 29, 55 (1992). 10.1016/0304-3886(92)90006-F
19. A. R. M. Verschueren, P. H. L. Notten, L. J. M. Schlangen, F. Strubbe, F. Beunis, and K. Neyts, J. Phys. Chem. B 1089-5647 112, 13038 (2008). 10.1021/jp800675w
20. F. Beunis, F. Strubbe, M. Marescaux, J. Beeckman, K. Neyts, and A. R. M. Verschueren, Phys. Rev. E 1063-651X 78, 011502 (2008). 10.1103/PhysRevE.78. 011502
21. J. Kim, J. L. Anderson, S. Garoff, and L. J. M. Schlangen, Langmuir 0743-7463 21, 8620 (2005). 10.1021/la040110+
22. M. F. Hsu, E. R. Dufresne, and D. A. Weitz, Langmuir 0743-7463 21, 4881 (2005). 10.1021/la046751m