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Applied Physics Letters

Volumn 97, Issue 18, 2010, Pages

In situ spectroscopic ellipsometry studies of trivalent chromium coating on aluminum

(2) Dardona, Sameh a Jaworowski, Mark a

a UNITED TECHNOLOGIES RESEARCH CENTER (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AL SUBSTRATE; CAUCHY DISPERSION; CHEMICAL THINNING; CONVERSION COATINGS; FILM FORMATIONS; IMMERSION TIME; IN-SITU; INITIAL STAGES; NATIVE OXIDE LAYER; SPECTRAL REGION; TRIVALENT CHROMIUM; TRIVALENT CR;

ALUMINUM COATINGS; CHROMATE COATINGS; CHROMIUM; OPTICAL CONSTANTS; SPECTROSCOPIC ELLIPSOMETRY;

FILM GROWTH;

EID: 78649297263 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3511472 Document Type: Article

Times cited : (30)

References (9)

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