Cereal grain size measurement based on image processing technology

Proceedings of 2010 International Conference on Intelligent Control and Information Processing, ICICIP 2010

Volumn , Issue PART 2, 2010, Pages 209-212

  Wu, Yong ^a   Yi, Pan ^a  

^a HENAN UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CEREAL GRAINS; DIGITAL IMAGE PROCESSING; GRAIN NUMBERS; GRAIN SIZE PARAMETERS; HIGH EFFICIENCY; IMAGE MEASUREMENTS; IMAGE PROCESSING TECHNOLOGY; MEASUREMENT METHODS; MORPHOLOGICAL RECONSTRUCTION;

DATA PROCESSING; GRAIN SIZE AND SHAPE; IMAGE ENHANCEMENT; IMAGING SYSTEMS; INTELLIGENT CONTROL;

IMAGE SEGMENTATION;

EID: 78649295746     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICICIP.2010.5564253     Document Type: Conference Paper

References (8)

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